Microscopy is often underutilized as a tool for solid-state characterization. Listed below are the numerous forms of microscopy that can be performed at SSCI. We routinely use results from microscopy studies to complement analytical data from other techniques to address your solid-state characterization issues. Microscopy with appropriate sample handling is also a powerful tool for trace analysis.

  • Light microscopy including: polarizing, bright field, and dark field
  • Fluorescence
  • Infrared (IR)
  • Raman
  • Scanning Electron Microscopy (SEM)
    • High Vacuum
    • Low Vacuum
    • Energy Dispersive X-ray Analysis (EDX)
  • Hot Stage (light microscopy, IR, Raman)
  • Cold stage (light microscopy, IR, Raman)
  • Stereomicroscopy